For over 50 years Polytec has been providing optical measurement solutions for research and industry. Today's laser-based instruments and sensor systems allow the measurement and evaluation of dynamic and mechanical properties as well as topographic characteristics of test objects. The Micro System Analyzers series enables a systematic testing of MEMS devices and microstructures with resolutions down to the picometer range while covering frequencies up to the GHz regime. The 3D surface metrology characterizes the micro-topography including form parameters, roughness and texture. Polytec supports customers to drive their own microsystems innovations and to strengthen their own leadership.